Defect Inspection Equipment Product List and Ranking from 4 Manufacturers, Suppliers and Companies

Defect Inspection Equipment Product List

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Surface scratch, foreign object inspection, and defect inspection! Fine defect inspection device.

Surface scratch, foreign object inspection, and defect inspection! Fine defect inspection device.

With an optical resolution of "1.8μm," it enables very high-precision inspections. It can also accommodate dimensional measurements and inspect two-dimensional punched products, among others.

This is a two-dimensional inspection device using a high-resolution camera and a high-precision X-Y stage. It is suitable for inspecting surface scratches and foreign objects on optical films, sheets, and touch panels, as well as for defect inspection. With an optical resolution of "1.8μm," it enables very high-definition inspections. It can also accommodate dimensional measurements and inspect two-dimensional punched products. 【Features】 - Automatically saves inspection data and images - Camera resolution: 9 million pixels - High optical resolution (1.8μm) allows for clear viewing of fine inspection areas - Ideal for inspecting peripheral electrodes of touch panels and disconnections or short circuits in fine wiring of printed circuit boards *For more details, please download the materials or contact us.

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Hard Disk Surface Defect Inspection Device - Laser Explorer

Hard Disk Surface Defect Inspection Device - Laser Explorer

Detecting fine surface defects such as scratches and pits on the surface of hard disks.

By irradiating the surface of the hard disk with a high-power laser, we detect fine surface defects such as scratches and pits, classify them by defect type, and display the results. Not only can we detect scratches with high sensitivity through simultaneous irradiation of multiple lasers, but we can also determine the uneven shapes of the defects. Features: - Detection of minute defects using high-power lasers - High scratch detection capability - Discrimination of defect unevenness - Automatic focus for all units - Excellent cost performance - Customization support - Automatic inspection for one cassette - Compatible with transparent glass substrates

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Laser-type wafer surface defect inspection device - Laser Explorer

Laser-type wafer surface defect inspection device - Laser Explorer

Transparent wafers also undergo high-speed inspection! High-output lasers detect tiny scratches and particles!

The "Laser Explorer" is the latest wafer surface defect inspection device that also supports transparent wafers. A high-power laser detects minute defects such as scratches, pits, and particles! It can be utilized for shipping and receiving inspections of wafers, as well as for quality control in the epitaxial process! 【Other Features】 ■ High throughput (inspects 25 wafers in a cassette in about 40 minutes) ■ Discriminates the unevenness of defects ■ Automatic focusing for all samples ■ Customization support ■ Automatic inspection for one cassette ■ High-precision marking for defects (optional) ■ Defect review using a laser microscope (optional)

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[Image Processing Related] OEM Product Digital Defect Inspection Device

[Image Processing Related] OEM Product Digital Defect Inspection Device

We uphold a commitment to "quality above all" and confidently and responsibly deliver our products.

All planning proposals, order-taking, contract manufacturing, and the development and production of OEM products are fundamentally based on wisdom, passion, and originality. Our work at Nissho Electric Co., Ltd. encompasses a wide range of activities, including the design, manufacturing, and sales of various devices, software development, and system design. We have obtained international certifications ISO 9001:2015 and ISO 14001:2015, establishing a globally recognized management system. We operate effectively under an Integrated Management System (IMS), managing quality improvement and stabilization, as well as the design and manufacturing of environmentally conscious products, through step-by-step checks based on policy documents (design policy documents, manufacturing policy documents, countermeasure policy documents, etc.) from order to delivery, as a company-wide theme. With foresight to predict market trends, we propose plans for hardware or software and respond to various requests for product development by leveraging our advanced technological capabilities. This unwavering spirit is supported by the energy and original ideas of our staff.

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Appearance defect inspection machine

Appearance defect inspection machine

L1800 color general-purpose machine - Introducing a wide lineup including the eight-sided machine and E3000 color-specific type!

We would like to introduce our "Appearance Defect Inspection Machine." It features dedicated software specifically designed for fixed-shape inspection objects, allowing for easy and quick material change settings with the "E3000 Color Dedicated Type," and thanks to the quick-change glass design, it can be converted in 3 minutes without flatness correction with the "E8000 Color Compact Dedicated Type." Please feel free to contact us if you have any inquiries. 【Product Lineup】 ■ E3000 Color Dedicated Type ■ L1800 Color Universal Machine - Octagonal Machine ■ E8000 Color Compact Dedicated Type *For more details, please download the PDF or feel free to contact us.

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Wafer surface defect inspection device with review function

Wafer surface defect inspection device with review function

Equipped with a review microscope! Defects detected can be observed in real-time with the microscope.

By irradiating a high-power laser onto a wafer on a rotating stage, the entire surface is inspected at high speed, detecting minute defects. By combining multiple channels such as scattering, reflection, and phase shift, defect detection suitable for various applications can be achieved, allowing for discrimination based on defect types such as unevenness. ■ Features of the device - High-speed inspection (approximately 181 seconds for 12 inches) - Equipped with a review microscope - The microscope can be selected as either a laser microscope or a differential interference microscope - High-precision scribing using the microscope for analysis with SEM, etc. - Optional edge inspection functionality available

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Microscopic wafer surface defect inspection device

Microscopic wafer surface defect inspection device

High-precision inspection equipment compatible with transparent materials.

This is a surface defect inspection device equipped with a differential interference microscope, which is also applicable to transparent materials. It is capable of outputting defect maps through comprehensive inspections and allows for microscopic observation of detected defects. ■ Features of the device - Defect extraction and discrimination functions using proprietary image processing technology - High-precision marking while observing defects - Enables observation and creation of defect albums based on defect coordinates for wafers inspected by other devices - Development of a crystal defect detection function is underway.

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